Applications now available for in-situ testing of ASICs with imbedded ARC5 family of Processors. JTAG drivers support complete functional test of memory and register space.  Up to 40 components may be tested per test interface with individual voltage regulation and I/V monitoring. Supports both broadcast and individual initialization. OPCTL support for full environmental control.

Test chambers may be sized to your engineering needs.

AMT's Automated Burn-in Testing Services division has just introduce fully monitored customized burn-in featuring Optimum based control and test interface designs. Let them quote your next difficult screening requirement.