Applications now available for
in-situ testing of ASICs with
imbedded ARC5 family of
Processors. JTAG drivers support complete
functional test of memory and register
space. Up to 40 components may be
tested per test interface with individual
voltage regulation and I/V monitoring.
Supports both broadcast and individual
initialization. OPCTL support for
full environmental control.
Test chambers may be sized to your
AMT's Automated Burn-in Testing
Services division has just introduce fully
monitored customized burn-in featuring
Optimum based control and test interface
designs. Let them quote your next
difficult screening requirement.