Microtechnology has extended
the application of its Optimum
product line with the
ARC5 imbedded test functions. Up to
40 controllers may be independently
powered and monitored for
functionality using the process test
interface of the Optimum WinAOS
application. Each part may have 2
separate biases featuring both
current and voltage monitoring.
Independent test is implemented
through a standard JTAG interface. A
separate serial clock and command
interface may be used if required to
provide device initialization
sequences. JTAG control is
muxed to each part through the use
of an independent clock for each
part. All of the ARC processor
registers and memory space may be
tested through the JTAG I/O.
protocol enables time, temperature
and voltage control variables for
complete control of the test
process. The standard test
procedures of the Optimum burn-in
process may be modified as desired
using the OPCTL test language. Both
standard and non standard processes
are support with the Optimum
test software interface.
controllers that support the JTAG
interface specification can be
tested using this system. The AMT
test library can be extended to meet
any unique test requirements.
our engineering sales support to
discuss your specific applications.